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It is possible to observe cross-sections while observing FIB processing in real time.
A new method for structural analysis of electronics products manufactured with nanoscale precision, such as semiconductor devices, MEMS, and TFTs: We propose cross-beam FIB for cross-sectional observation.
![[Data] Cross-sectional observation of solar cell modules](https://image.mono.ipros.com/public/product/image/cc1/2000561879/IPROS02201267418243097889.png?w=280&h=280)
We have published cross-sectional observations of the fracture surface and elemental maps of the fracture area!
This document introduces the cross-sectional observation of solar cell modules. An inspection was conducted on a solar cell module that underwent thermal shock testing, and upon performing a cross-sectional observation of the identified abnormal areas, it was confirmed that the interconnector solder joint had fractured. [Contents] - Cross-sectional observation of the fracture - Element map of the fracture *For more details, please refer to the PDF document or feel free to contact us.
It is possible to confirm the cross-sectional structure and elemental distribution without damaging fine structures such as grain separation!
We would like to introduce our "Cross-sectional Observation of Automotive Bumper Coating Films." The coating film of automotive bumpers has a multi-layer structure using several types of paint. In general mechanical polishing for cross-sectional observation, issues such as the detachment of added fine particles occur, making it difficult to confirm the correct structure. By using the ion milling method (Ar+ ion beam) for processing, we can observe the cross-sectional structure and elemental distribution without damaging the fine structures such as detachment. 【Features】 ■ SEM observation allows for clear confirmation of the multi-layer structure of the coating film and the added fine particles. ■ By combining elemental analysis, we can clearly confirm the distribution of each added particle. *For more details, please download the PDF or feel free to contact us.
